XRF (K SERIES)- BOWMAN

Origin: America

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The K Series is a high-precision XRF system designed for diverse sample analysis, featuring a large 12″ x 12″ measurable area, programmable X-Y stage, and auto multi-collimator for flexible spot sizes. Its variable-focus camera (0.25″ to 3.5″) and table view navigation enable effortless measurements. For ultra-small features, the poly-capillary optics version offers 15μm resolution, high-precision stage (2µm), and 140x magnification camera with digital zoom. Equipped with an SDD detector and long-life X-ray tube, it ensures accuracy and compliance with ASTM B568, ISO 3497, and IPC-4552

MODEL: XRF K SERIES

SPECIFICATION

Element Range: Aluminium 13 to Uranium 92
X-ray excitation: 50 W (50kV and 1mA) micro-focused W anode tube (Cr, Mo, Rh anodes available)
Detector: Collimated: Silicon solid state detector with 190eV resolution or better

Optics: Large Window Silicon solid state detector with 190eV resolution or better

Number of analysis layers and elements: 5 layers (4 layers + base) and 10 elements in each layer. Composition analysis of up to 30 elements simultaneously
Filters/Collimators: Collimated: 4 primary filters / 4 motorized collimators

Optics: 4 primary filters

Focal Depths: Collimated: Multi fixed focal depths with laser and image autofocus

Optics: Output Focal Depth Fixed at 0.15″ (3.81mm)

Digital Pulse Processing: 4096 CH digital multi-channel analyzer with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 2x 1/3″ CMOS- 2688×1520 Resolution
Video Magnification: Collimated: 30X Micro & 7X Digital Zoom: Standard; 55X Micro Optional; Optional Tableview

Optics: 140X Micro, 7X digital Zoom, 9X Macro & Table View

Power Supply: 480W, 100~240 volts; frequency range 47Hz to 63Hz
Weight: 270 Lbs/ 120 Kg
Programmable XY: Table size: 12″ (305mm) x 12″ (305 mm)

XY Travel: 12″ (305mm) x 12″ (305mm)

Collimated: Stage precision: 10.2um (400uin)

Optics: Stage precision: <2um (80uin)

Internal Dimensions: Height: 229mm (9″), Width: 610mm (24″), Depth: 610mm (24″)

Collimated: Max Z travel: 8.75″

Optics: Max Z travel: 8.5″

External Dimensions: Height: 668mm (26.3″), Width: 711mm (28.0″), Depth: 922mm (36.3″)

PRODUCT VIEWED

The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.