AURISPEC EDX-V63 Vaccum XRF – YUANYIN

Origin: China

Brand:

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This series are primarily utilized for material elemental composition analysis across all stages of complete mining process.

Basic Info.

Model NO. EDX-V63 Element F-Am
Analysis X-ray Fluorescence Display Computer Screen
Application Metal Frequency 50±1HZ
Performance Automation Function Ore Analyzer
Weight 106kg Power Source AC220V±22V
Customized Customized Detector Super Fast Sdd
X-ray Source 50kv/200ua Measurement Content Range 0.2ppm~99.99%
Transport Package Pallet Trademark Aurispec
Origin China HS Code 9027300090

Product Description

This model is expert in Mineral/Ore Analysis area and it is primarily used for:
– Mining operations: exploration, extraction, grade control
– Industrial minerals: process control and quality control
– Other fields: raw materials for cement and building materials production, refractory materials, ceramics and glass, geochemical academic research, archaeology, etc
– The new generation of Fast SDD detector, featuring a brand-new vacuum optical system and ultra-high resolution technology, achieves optimal analysis results for the following light, medium, and heavy elements as well as common oxides.
– Excellent analytical performance covers various minerals:
Iron ore: magnetite, hematite, ilmenite, siderite, etc
Copper ore: chalcopyrite, cuprite, malachite, etc
Chromium ore: chromite spinel, chromite, chromite-bismuthite, etc
Molybdenum ore: molybdenite, copper-molybdenum ore, tungsten-molybdenum ore, etc
Tungsten ore: scheelite, wolframite, cassiterite, etc
Tantalum ore: tantalite, niobite, pyrochlor, etc
Lead-zinc ore: galena, sphalerite, cerusite, etc
Nickel ore: laterite nickel ore, copper-nickel sulfide ore, etc
Bauxite and other minerals

Product Parameters

Item EDX-V63Benchtop XRF
Application scope Mineral/Soil
Measurement Range Na-U
Measurement content Range 0.2 ppm–99.9%
Ambient Temperature -10°C–+35°C
Outside Dimensions (mm) 650 × 600 × 900
Test Chamber Dimensions (mm) 460 × 310 × 95Ø150 × 75 (vacuum)
Net Weight (kg) 106
Sampling process Direct measurement
High Voltage Power Supply US high-performance precision digital control (low ripple)
Operating system Windows 10
X-ray source 50KV/2mA, Super thin beryllium window, Micro local spot
Detector Super Fast SDD
Collimator + Filter 8 sets collimator (min 0.2 mm) and 7 filters auto switch
Software Aurispec SW (FP+EC)
Display External display
Sample camera HD camera
WIFI/Bluetooth Yes
Power supply 220ACV 50/60Hz
Other Integrated vacuum pumpHelium-filled (optional)

Our Advantages

– Miniaturization, high performance, high speed, easy operation, N high sensitivity, high precision analysis
– Simultaneously analyze 40 elements
– Adopting multi-collimator, multi-filter, and background subtraction patented technology
– The Peltier-cooled Super FAST SDD silicon drift detector offers excellent short-term repeatability and long-term reproducibility, as well as superior elemental peak resolution.
– It features an ultra-high counting digital multichannel circuit design, integrated dual vacuum pumping mechanisms, and an automatic vacuum stabilization system
– Standard basic parameter method software, multi-tasking, multi-window operation
– The patented thin-film filter technology effectively enhances the detection limit of light elements

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