Profilometer for Optics Surface SJ5720-OPT100 – CHOTEST

Origin: Tiongkok

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Application

 

 

 

 

 

                                 Lens                                                            Intraocular lens mold                                                          Vehicle Lens

 

                      Infrared lens                                                                            Lens                                                                  Optical mold

 

Details

Description

The SJ5720-OPT series is a capable to measure both surface roughness and profile after once scanning. Moreover, there is a dedicated software module for measurement and analysis of large aspheric surface, so this series is an ideal measurement solution for the optical lens industry.

It can also be used for profile and roughness measurement for large curved surface, such as bearings, artificial joints, precision molds, gears, blades, etc. Consequently, it is widely used in precision machining, automobiles, bearings, machine tools, molds, precision hardware and other industries.

Features

  1. 1. Evaluate profile and roughness parameters at the same time after once scanning
  2. 2. High precision, high stability, and high repeatability
  3. 3. Aspheric optical software module
  4. 4. Intelligent management and advanced software analysis system
  5. 5. Intelligent protection system during scanning
  6. 6. Flexible manual control
  7. 7. High stability vibration isolation system

Software

Professional aspheric surface measurement software can analyze all aspheric surface parameters.

There are some self-checking parameters in the software, so the correctness of the input formula can be determined by self-checking.

 

Aspheric surface measurement interface

Model No. SJ5720-OPT100
Profile
Measurement
Measuring Range X 0~100mm
Z 0~300mm
Z1 ±6mm(Optional: ±12mm)
Resolution 0.001um
Accuracy Z1 *1 ≤±(0.5+0.03 H)μm(H,mm)
Pt *2 Pt≤0.2μm
Standard Ball *3 ≤±(1+R/20)μm(R,mm)
Angle *4 ≤±1′
Moving
Speed
X 0~20mm/s
Z 0~20mm/s
Scanning Speed 0.05~5mm/s
X Straightness *5 ≤0.15μm/100mm
Measuring Force 0.5mN,0.75mN,1mN,2mN,3mN(Adjustable)
Roughness
Measurement
Ra Masurement Range Ra0.012μm~Ra12.5μm
Accuracy *6 Ra0.012μm ~ Ra3 . 2 μm: ≤±(3nm+2.0%A),A(Ra)μm
Ra3.201μm ~ Ra12.5μm : ≤±(3nm+3.5%A),A(Ra)μm
Repeatability (1δ) *7 1δ≤1nm
Measurement Residual *8 Rq≤3nm
Roughness Parameters R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rq, Rsk, Rku, RSm, RPc, Rdq, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpq, Rvq, Rmq, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, R5z, R3z, Rh, Dq, Lq, SD
Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2
Profile: Pa, Pq, Pt, Pz, Pp, Pv, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profl, Edge, StpWd, Bumpht
Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4)
Motif: R, AR, W, AW, Rx, Wx, Wte, Nr, Ncrx, Nw, Cpm, CR, CF, CL
ISO5436: Pt5436, D
Aspheric Masurement Parameters Micro profile parameters: Pt, Pa, Fig;  Inclination parameters: Smx , Smn ;
Horizontal axis angle parameter: Tilt;
Distance parameters between the optical axis and the contour: Xp , Xv , Xt ;
Root mean square roughness parameter: RMS;
Slope parameters: Slpe mx , Slpemx (x), Slperms;
Vertex radius error parameter: Radius Err
Filter Gaussian filter, 2RC filter, zero phase filter
Sampling Length 0.008, 0.08, 0.25, 0.8, 2.5, 8.0 or 25mm Selectable
Evaluation Length Auto calculation
Size(L×W×H) 600×350×890(mm)
Weight 195kg
*1 The accuracy is based on the measurement standard gauge block.
*2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
*3 The accuracy is based on the verifcation of the ф 50mm standard ball with the arc exceeds 90 degrees.
*4 The accuracy is based on the measurement of the angle of polygonal prism.
*5 The accuracy is based on the measurement of optical flat.
*6 The accuracy is based on the measurement of standard roughness block.
*7 The repeatability is based on the measurement of 0,1-0.2μm square wave roughness block and standard step height block.
*8 The accuracy is is based on the measurement of 1 nm level roughness block and optical flat.

PRODUCT VIEWED

Details Functions 1. Surface contour evaluation: It can evaluate radius, angle, distance, coordinates, circle, circular cross section, and determine the points, each intersectant point, coordinate axis, straight line, vertical line, circle and circular cross section, and analyze the straightness, roundness of contour; More functions:  (1)Establish a regression line and a circle (2)Establish the points, intersectant points,...

Dedicated Functions for Semiconductor Field Measure profile trenches after laser grooving in the dicing process. Measure film step-height of wafer ranging from 1nm~1mm. Measure roughness of silicon cut sheet after grinding process, and can measure dozens of small areas to obtain the average value by one click. Support 6″, 8″ and 12″ wafer measurement, and...

Functions 1. Once Scanning for both Profile and Roughness parameters such as Ra and Pt 2. Surface roughness: R parameter, P parameter, W parameter, etc. 3. Surface profile evaluation: It can evaluate radius, angle, distance, coordinates, circle, circular cross section, and determine the points, each intersectant point, coordinate axis, straight line, vertical line, circle and...