Measuring Machine
Nano 3D Optical Surface Profilometers SuperView W1 – CHOTEST
The SuperView W1 is a high-precision Nano 3D Optical Surface Profilometer developed by Chotest Technology Inc., designed for non-contact measurement and analysis of surface topography and roughness at the sub-nanometer level. Utilizing white light interferometry, it is suitable for applications in semiconductor manufacturing, 3C electronics, ultraprecise machining, optical engineering, micro-nano materials, and MEMS industries
Measuring Machine
Nano 3D Optical Surface Profilometers SuperView W1-Lite – CHOTEST
The SuperView W1-Lite is a compact, high-precision Nano 3D Optical Surface Profilometer developed by Chotest Technology Inc. Designed for non-contact, sub-nanometer surface measurements, it utilizes white light interferometry combined with precision Z-axis scanning and 3D modeling algorithms. This makes it suitable for applications in semiconductor manufacturing, 3C electronics, ultraprecise machining, optical engineering, micro-nano materials, and MEMS industries.
Measuring Machine
Nano 3D Optical Surface Profilometers SuperView W1-Ultra – CHOTEST
The SuperView W1-Ultra is an advanced Nano 3D Optical Surface Profilometer developed by Chotest Technology Inc., designed for high-precision, non-contact surface measurements across various industries. Here's an overview of its key features and specifications.
Measuring Machine
Nano 3D Optical Surface Profilometers SuperView W3 – CHOTEST
The SuperView W3 is a high-precision Nano 3D Optical Surface Profilometer developed by Chotest Technology Inc. It employs white light interferometry combined with a precision Z-axis scanning module and advanced 3D modeling algorithms to perform non-contact surface measurements with sub-nanometer resolution. This instrument is designed for detailed analysis of surface roughness, flatness, waviness, and other topographical features across various industries.
Measuring Machine
Profile and Roughness Measuring Machine SJ5730-100 – CHOTEST
The Chotest SJ5730-200 is a high-precision 2D profilometer designed for comprehensive surface profile and roughness measurements. Manufactured by Chotest Technology Inc., this instrument integrates advanced features suitable for quality control and precision engineering applications.
Measuring Machine
Profile and Roughness Measuring Machine SJ5730-200 – CHOTEST
The Chotest SJ5730-200 is a high-precision 2D profilometer designed for comprehensive surface profile and roughness measurements. Manufactured by Chotest Technology Inc., this instrument integrates advanced features suitable for quality control and precision engineering applications.
Measuring Machine
Item No.: SJ5718-P Product name: Profile measuring machine X-axis measuring range: 0~100mm X-axis indication error: ±(0.6+0.02L)µm(L,mm) Z1-axis measuring range: ±30mm Z1-axis resolution: 0.001μm Z1-axis indication error: ±(0.6+|5H)µm(H,mm) Scanning speed: 0.06~5mm/s Manufacturer: Chotest Technology Inc.
Measuring Machine
Item No.: SJ5718-PR Product name: Profile measuring machine X-axis measuring range: 0~100mm X-axis indication error: ±(0.6+0.02L)µm(L,mm) Z1-axis measuring range: ±30mm Z1-axis resolution: 0.001μm Z1-axis indication error: ±(0.6+0.05H)µm(H,mm) Scanning speed: 0.05~5mm/s Manufacturer: Chotest Technology Inc.