Alat Uji Baterai
Dengan ukuran jejak sekecil 360mm*450mm, kamar mini Neware sangat cocok untuk pengujian baterai batch kecil di laboratorium penelitian dan pengembangan.
Sistem pemantauan jarak jauh MicronView mengintegrasikan perangkat lunak pemantauan lingkungan EMC System, perangkat terminal, dan berbagai fungsi, termasuk penilaian risiko, pengelolaan rencana dan tugas, pemantauan real-time, serta pengelolaan data dan perangkat. Sistem ini mengimplementasikan prinsip-prinsip inti dari Strategi Pengendalian Kontaminasi Lingkungan (EM-CCS) dengan menyediakan solusi komprehensif untuk pemantauan dan pengendalian kontaminasi di lingkungan kritis.
Penguji Kebocoran
Oxipack MLT (Multi Leak Detection) dirancang dengan komponen yang mampu menguji berbagai jenis produk kaku seperti pod, kapsul, kaleng, dan toples. Oxipack Multi Leak Tester menggunakan metode vacuum decay untuk deteksi kebocoran yang efektif dan non-destruktif.
Mesin Pengukur Mikroskopi
Nano 3D Optical Surface Profilometers SuperView W1 – CHOTEST
SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning module and 3D modeling algorithm, it contactlessly scans the surface of the object then establish a 3D image for the surface. A serial of...
Mesin Pengukur Mikroskopi
Nano 3D Optical Surface Profilometers SuperView W1-Lite – CHOTEST
SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning module and 3D modeling algorithm, it contactlessly scans the surface of the object then establish a 3D image for the surface. A serial of...
Mesin Pengukur Mikroskopi
Nano 3D Optical Surface Profilometers SuperView W1-Ultra – CHOTEST
SuperView W1-Ultra Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning module and 3D modeling algorithm, it contactlessly scans the surface of the object then establish a 3D image for the surface. A serial of...
Mesin Pengukur Mikroskopi
Nano 3D Optical Surface Profilometers SuperView W3 – CHOTEST
Dedicated Functions for Semiconductor Field Measure profile trenches after laser grooving in the dicing process. Measure film step-height of wafer ranging from 1nm~1mm. Measure roughness of silicon cut sheet after grinding process, and can measure dozens of small areas to obtain the average value by one click. Support 6″, 8″ and 12″ wafer measurement, and...
Alat Uji Baterai
Neware BTS9000: penguji/siklus/analis baterai paling canggih untuk membantu Anda menemukan material baterai masa depan.